IEEE P1581: To Live or Let die?

P1581 Status and Technical update

Since 2001 the IEEE p1581 working group aims to provide a test standard for memories that cannot have boundary scan. Currently this p1581 activity focuses on test access and test circuitry. The latter came to a resolution and will be explained. Economic advantages for the user of p1581 devices and further work will be discussed.

An Economical Alternative to Boundary Scan in Memory Devices (White Paper of the IEEE P1581 Working Group)

IEEE P1581 proposes a standard means of including test features in a memory device, which can collaborate with other 1149.1 Boundary-Scan devices, without requiring boundary scan circuitry, complex controllers or dedicated test pins. The result is a memory device design suitable for printed circuit board (PCB) applications, including those where design for test overhead is often deemed economic...

Live or let die; who decides an incompetent's fate? In re Storar and In re Eichner.

Let Live and Let Die: Handling the State of Hash-based Signatures

Real-world use of digital signatures currently relies on algo­ rithms that will be broken once quantum computers become available. Quantum-safe alternatives exist; in particular, hash-based schemes offer adequate performance and security and are seen as a fitting solution for post-quantum signatures. Unfortunately, they are not used at large because practical hurdles have not yet been overcome....

Live and Let Die: LSC-Based Verification of UML-Models

We present a strategy for automatic formal verification of Live Sequence Chart (LSC) specifications against UML models in the semantics of [7] employing the symmetry-based technique of Query Reduction [18, 34, 44] and the abstraction technique Data-type Reduction [34]. Altogether this allows for automatic formal verification without providing finite bounds on the numbers of objects created duri...